DDR3/4 Combo 10 Library Design in 28NM CMOS Technology
Abstract
This paper presents a DDR3 and DDR4 dual mode combo IO library containing half duplex combo transceiver, a separate calibration cell for ZQ calibration and Power/GNDcells with RC clamp for ESD protection in 28nm CMOS technology. The presented transceiver achieves 2166MT/s for DDR3 at 1.SV for two dual rank UDIMMs/channel and 2400MT/s for DDR4 at 1.2V for a single dual rank UDIMM. The embedded break before make functionality in the transmitter demonstrates a 17% reÂduction in crow-bar current at 2166MT/s.The slew rate control functionality demonstrates feasibilÂity in reducing reflection on an under-damped channel as well as reducing simultaneous-switch ing-output noise. The ESD protection is targeted for 2KV-HBM,8KV-MM& SA COM. The transmitter consumes a total power of 7.SmW/[email protected] and 5.8mW/[email protected] with a break before make a non-overlap delay of 60ps. Each cell has a footprint of 30µmx200µ and results in a continuously abutted structure when placed side by side.
KEYWORDS
SSTL, HSTL, POD, DDR3, DDR4, combo 10, multi-mode PHY, ZQ Calibration, Self-Biased Receiver, DIMM modeling, 28nm CMOS.
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